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371 

 194. C.R.Ast, G.Wittich, P.Wahl, R.Vogelgesang, D.Pacile, M.C.Falub, L.Moreschini, 

M.Papagno, M.Grioni, K.Kern, Phys.Rev.B 75(2007)201401-1-201401-4 

 195. A.L.de Lozanne, S.A.Elrod, C.F.Quate, Spatial Variation in the Superconductivity of 

Nb3Sn Measured by Low-Temperature Tunneling Microscopy, Phys.Rev.Lett. 

54(1985)2433-2436 

 196. O.Fisher, M.Kugler, I.Maggio-Aprile, C.Berthod, Scanning tunneling spectroscopy of 

high-temperature superconductors, Review of Modern Physics, 79(2007)353-419 

 197. A.Yazdani, B.A.Jones, C.P.Lutz, M.F.Crommie, D.M.Eigler, Probing the Local Effects 

of Magnetic Impurities on Superconductivity, Science 275(1997)1767-1770 

 198. П.И.Арсеев, Н.С.Маслова, С.И.Орешкин, В.И.Панов, С.В.Савинов, Сканирующая 

туннельная спектроскопия неравновесного взаимодействия примесных состояний 

на поверхности полупроводников, Письма в ЖЭТФ 72(2000)819-824 

 199. M.F.Crommie, C.P.Lutz, D.M.Eigler, Confinement of Electrons to Quantum Corrals on 

a Metal Surface, Science 262(1993)218-220 

 200. M.F.Crommie, Observing electronic scattering in atomic-scale structures on metals, 

Journal of Electron Spectroscopy and Related Phenomena 109(2000)1-17 

 201. D.Fujita, K.Amemiya, T.Yakabe, H.Nejoh, T.Sato, M.Iwatsuki, Anisotropic Standing-

Wave Formation on an Au(111)-(23x 3 )Reconstructed Surface, Phys.Rev.Lett. 

78(1997)3904-3907 

 202. J.G.Hou, K.Wang, Study of single molecules and their assemblies by scanning tunnel-

ing microscopy, Pure Appl.Chem. 78(2006)905-933 

 

203. 

R.Wiesendanger, L.Eng, H.R.Hidber, P.Oelhafen, L.Rosenthaler, U.Staufer, 

H.J.Guntherodt, Local tunneling barrier height images obtained with the scanning tun-

neling microscope, Surf.Sci. 189-190(1987)24-28 

 204. R.Schuster, J.V.Barth, J.Wintterlin, R.J.Behm, G.Ertl, Distance dependence and corru-

gation in barrier-height measurements on metal surfaces, Ultramicroscopy, 42-

44(1992)533-540 

 205. M.Yoon, H.Mai, R.F.Willis, Large modulation-amplitude, local barrier-height, scanning 

tunneling microscopy, Europhys.Lett. 54(2001)626-632 

 206. S.Kurokawa, Y.Yamashita, A.Sakai, Y.Hasegawa, Scanning Tunneling Microscopy 

Barrier-Height Imaging of Shockley Dislocations on a Au(111) reconstructed Surface, 

Jpn.J.Appl.Phys. 40(2001)4277-4280 

 

207. 

R.Wiesendanger, M.Ringger, L.Rosenthaler, H.R.Hidber, P.Oelhafen, H.Rudin, 

H.J.Guntherodt, Application of scanning tunneling microscopy to disordered systems, 

Surf.Sci. 181(1987)46-54 


background image

372 

 208. R.Akiyama, T.Matsumoto, T.Kawai, Capacitance of a molecular overlayer on the sili-

con surface measured by scanning tunneling microscopy, Phys.Rev.B 62(2000)2034-

2038 

 209. G.Seine, R.Coratger, A.Carladous, F.Ajustron, R.Pechou, J.Beauvillain, Imaging using 

tip-surface distance variations vs. voltage in scanning tunneling microscopy, Surf.Sci. 

465(2000)219-226 

 

210. 

R.C.Jaklevic, J.Lambe, Molecular Vibration Spectra by Electron Tunneling, 

Phys.Rev.Lett. 17(1966)1139-1140 

 211. C.Petit, G.Salace, Inelastic electron tunneling spectrometer to characterize metal-oxide-

semiconductor devices with ultrathin oxides, Review of Scientific Instruments, 

74(2003)4462-4467 

 212. K.W.Hipps, Copper(II)Phtalocyanine: Electronic and Vibrational Tunneling Spectra, 

J.Phys.Chem. 93(1989)5958-5960 

 213. K.W.Hipps, U.Mazur, An Experimental Study of the Line Shape of Orbital Mediated 

Tunneling Band Seen in Inelastic Electron Tunneling Spectroscopy, J.Phys.Chem.B 

104(2000)4707-4710 

 214. W.Wang, T.Lee, I.Kretzschmar, M.A.Reed, Inelastic Electron Tunneling Spectroscopy 

of an Alkanedithiol Self-Assembled Monolayer, Nanolett. 4(2004)643-646 

 215. J.Kirtley, J.T.Hall, Theory of intensities in inelastic-electron tunneling spectroscopy ori-

entation of adsorbed molecules, Phys.Rev.B 22(1980)848-856 

 216. G.Binnig, N.Garcia, H.Rohrer, Conductivity sensitivity of inelastic scanning tunneling 

microscopy, Phys.Rev.B, 32(1985)1336-1338 

 217. H.J.Lee, W.Ho, Single-Bond Formation and Characterization with a Scanning Tunnel-

ing Microscope, Science 286(1999)1719-1722 

 218. T.Komeda, Y.Kim, M.Kawai, B.N.J.Persson, H.Ueba, Lateral Hopping of Molecules 

Induced by Excitation of Internal Vibration Mode, Science 295(2002)2055-2058 

 219. B.C.Stipe, M.A.Rezaei, W.Ho, Single-Molecule Vibrational Spectroscopy and Micros-

copy, Science, 280(1998)1732-1735 

 220. J.R.Hahn, H.J.Lee, W.Ho, Electronic Resonance and Symmetry in Single-Molecule Ine-

lastic Electron Tunneling, Phys.Rev.Lett. 85(2000)1914-1917 

 221. A.S.Hallback, N.Oncel, J.Huskens, H.J.W.Zandvliet, B.Poelsema, Inelastic Electron 

Tunneling Spectroscopy on Decanethiol at Elevated Temperatures, Nanolett. 

4(2004)2393-2395 


background image

373 

 222. Y.Sainoo, Y.Kim, T.Komeda, M.Kawai, Inelastic tunneling spectroscopy using scan-

ning tunneling microscopy on trans-2-butene molecule: Spectroscopy and mapping of 

vibrational feature, J.Chem.Phys. 120(2004)7249-7251 

 223. B.N.J.Persson, A.Baratoff, Inelastic Electron Tunneling from a Metal Tip: The Contri-

bution from Resonant Processes, Phys.Rev.Lett. 59(1987)339-342 

 224. P.Muralt, D.W.Pohl, W.Denk, Wide-range, low-operating-voltage, bimorph STM: Ap-

plication as potentiometer, IBM J.Res.Develop. 30(1986)443-450 

 225. P.Muralt, D.W.Pohl, Scanning tunneling potentiometry, Appl.Phys.Lett. 48(1986)514-

516 

 226. P.Muralt,  GaAs  pn junction studied by scanning tunneling potentiometry, 

Appl.Phys.Lett. 49(1986)1441-1443 

 227. P.Muralt, H.Meier, D.W.Pohl, H.W.M.Salemink, Scanning tunneling microscopy and 

potentiometry on a semiconductor heterojunction, Appl.Phys.Lett. 50(1987)1352-1354 

 228. J.R.Kirtley, S.Washburn, M.J.Brady, Scanning tunneling measurements of potential 

steps at grain boundaries in the presence of current flow, IBM J.Res.Develop. 

32(1988)414-418 

 229. J.R.Kirtley, S.Washburn, M.J.Brady, Direct Measurement of Potential Steps at Grain 

Boundaries in the Presence of Current Flow, Phys.Rev.Lett. 60(1988)1546-1549 

 230. J.P.Pelz, R.H.Koch, Extremely low-noise potentiometry with a scanning tunneling mi-

croscope, Rev.Sci.Instrum. 60(1989)301-305 

 231. G.P.Kochanski, Nonlinear Alternating-Current Tunneling Microscopy, Phys.Rev.Lett. 

62(1989)2285-2288 

 232. B.Michel,  W.Mizutani,  R.Schierle, A.Jarosch, W.Knop, H.Benedickter, W.Bachtold, 

H.Rohrer, Scanning surface harmonic microscopy: Scanning probe microscopy based 

on microwave field-induced harmonic generation, Rev.Sci.Instrum. 63(1992)4080-4085 

 233. S.J.Stranick, P.S.Weiss, Alternating Current Scanning Tunneling Microscopy and 

Nonlinear Spectroscopy, J.Phys.Chem. 98(1994)1762-1764 

 234. S.J.Stranick, P.S.Weiss, A versalite microwave-frequency-compatible scanning tunnel-

ing microscope, Rev.Sci.Instrum. 64(1993)1232-1234 

 235. S.J.Stranick,  P.S.Weiss,  A tunable microwave frequency alternating current scanning 

tunneling microscope, Rev.Sci.Instrum. 65(1994)918-921 

 236. J.Schmidt, D.H.Rapoport, H.J.Frohlich, Microwave-frequency alternating current scan-

ning tunneling microscopy by difference frequency detection: Atomic resolution imag-

ing on graphite, Rev.Sci.Instrum., 70(1999)3377-3380 


background image

374 

 237. A.S.Blum, A.J.D.Schafer, T.Engel, An AC-STM Study of Mineral Sulfides and the Tip 

Induced Oxidation of PbS, J.Phys.Chem.B 106(2002)8197-8205 

 238. J.P.Bourgoin, M.B.Johnson, B.Michel, Scanning surface harmonic microscopy: Appli-

cation to silicon and Langmuir-Blodgett films on silicon, Microsc. Microanal. Micro-

struct. 5(1994)535-543 

 239. J.P.Bourgoin, M.B.Johnson, B.Michel, Semiconductor characterization with the scan-

ning surface harmonic microscope, Appl.Phys.Lett. 65(1994)2045-2047 

 240. M.B.Johnson, J.P.Bourgoin, B.Michel, Doping Profiling with Scanning Surface Har-

monic Microscopy, Microelectronic Engineering 27(1995)539-542 

 241. W.Seifert, E.Gerner, M.Stachel, K.Dransfeld, Scanning tunneling microscopy at micro-

wave frequencies, Ultramicroscopy 42-44(1992)379-387 

 242. L.A.Bumm, J.J.Arnold, M.T.Cygan, T.D.Dunbar, T.P.Burgin, L.Jones II, D.L.Allara, 

J.M.Tour, P.S.Weiss, Are Single Molecular Wires Conducting?, Science 

271(1996)1705-1707 

 243. S.Kurokawa, M.Yuasa, Y.Hasegawa, A.Sakai, Measurement of the tip-sample capaci-

tance for Si surfaces, Surf.Sci. 357-358(1996)532-535 

 244. A.Sakai, S.Kurokawa, Y.Hasegawa, Geometrical capacitance of the tip-semiconductor 

junction, J.Vac.Sci.Technol.A 14(1996)1219-1222 

 245. S.Kurokawa, A.Sakai, Tip-Sample Capacitance in STM, Sci.Rep.RITU A44(1997)173-

179 

 246. S.Kurokawa, A.Sakai, Gap dependence of the tip-sample capacitance, J.Appl.Phys. 

83(1998)7416-7423 

 247. H.Arakawa, R.Nishitani, Spatially resolved measurements of the capacitance by scan-

ning tunneling microscope combined with a capacitance bridge, J.Vac.Sci.Technol.B 

19(2001)1150-1153 

 248. H.P.Kleinknecht, J.R.Sandercock, H.Meier, An experimental scanning capacitance mi-

croscope, Scanning Microscopy 2(1988)1839-1844 

 249. H.Yokoyama, T.Inoue, J.Itoh, Nonresonant detection of electric force gradients by dy-

namic force microscopy, Appl.Phys.Lett. 65(1994)3143-3145 

 250. J.G.Hou, B.Wang, J.Yang, X.R.Wang, H.Q.Wang, Q.Zhu, X.Xiao, Nonclassical Behav-

ior in the Capacitance of a Nanojunction, Phys.Rev.Lett. 86(2001)5321-5324 

 251. S.Weiss, D.Botkin, D.F.Ogletree, M.Salmeron, D.S.Chemla, The Ultrafast Response of 

a Scanning Tunneling Microscope, Phys.Stat.Sol.(b) 188(1995)343-359 

 252. N.Nakaoka, K.Watanabe, Density-functional calculation of self-capacitances of carbon 

nanostructures, Thin Solid Films 464-465(2004)346-349 


background image

375 

 253. J.Wang, H.Guo, J.L.Mozos, C.C.Wan, G.Taraschi, Q.Zheng, Capacitance of Atomic 

Junctions, Phys.Rev.Lett. 80(1998)4277-4280 

 254. P.Pomorski, L.Pastewka, C.Roland,H.Guo, J.Wang, Capacitance, induced charges, 

and bond states of biased carbon nanotube systems, Phys.Rev.B 69(2004)115418-1-

115418-16 

 255. M.Buttiker, Capacitance, admittance, and rectification properties of small conductors, 

J.Phys.: Condens.Matter 5(1993)9361-9378 

 256. T.Christen, M.Buttiker, Low Frequency Admitance of a Quantum Point Contact, 

Phys.Rev.Lett. 77(1996)143-146 

 257. R.Nishitani, F.Begum, H.Iwasaki, Alternating Current of Scanning Tunneling Micro-

scope for Organic Molecules Adsorbed on Metal in Terms of Equivalent Circuit of 

Scanning Tunneling Microscope, Japanese Journal of Applied Physics 45(2006)1962-

1965 

 258. F.Muller, A.D.Muller, O.Meissner, A.Heilmann, M.Hietschold, Enhanced local surface 

conductivity measurements by scanning tunneling microscopy, Rev.Sci.Instrum. 

68(1997)3104-3107 

 259. Y.Majima, S.I.Miyamoto, Y.Oyama, M.Iwamoto, Tunneling current and surface poten-

tial simultaneous measurement using a scanning probe, Japanese Journal of Applied 

Physics 37(1998)4557-4560 

 260. Y.Oyama, Y.Majima, M.Iwamoto, Analysis of scanning probe used for simultaneous 

measurement of tunneling current and surface potential, J.Appl.Phys. 86(1999)7087-

7093 

 261. Y.Majima, Y.Oyama, M.Iwamoto, Measurement of semiconductor local carrier concen-

tration from displacement current-voltage curves with a scanning vibrating probe, 

Phys.Rev.B 62(2000)1971-1977 

 262. Y.Majima, S.Uehara, T.Masuda, A.Okuda, M.Iwamoto, The waveform separation of 

displacement current and tunneling current using a scanning vibrating probe, Thin Solid 

Films 393(2001)204-209 

 263. A.D.Muller, F.Muller, M.Hietschold, Detecting work-function differences in scanning 

tunneling microscopy, Appl.Phys.Lett. 74(1999)2963-2965 

 264. M.Herz, Dynamische Tunnel-, Kraft- und Reibungsmicroscopie mit atomarer und sub-

atomarer Auflosung, Dissertation, Lehmanns Media, Berlin, 2004, 117 S. 

 265. M.Herz, C.Schiller, F.J.Giessibl, J.Mannhart, Simultaneous current-, force-, and work-

function measurement with atomic resolution, Appl.Phys.Lett. 86(2005)153101-1-

153101-3