Файл: Сканирующая зондовая микроскопия диссертация.pdf

401 

 608. J.S.Villarrubia, Scanned probe microscope tip characterization without calibrated tip 

characterizers,J.Vac.Sci.Technol.B 14(1996)1518-1521 

 609. S.Dongmo,  M.Troyon,  P.Vautrot,  E.Delain, N.Bonnet, Blind restoration method of 

scanning tunneling and atomic force microscopy images, J.Vac.Sci.Technol.B 

14(1996)1552-1556 

 610. P.M.Williams, K.M.Shakesheff, M.C.Davies, D.E.Jackson, C.J.Roberts, S.J.B.Tendler, 

Blind reconstruction of scanning probe image data, J.Vac.Sci.Technol.B 14(1996)1557-

1562 

 611. J.S.Villarrubia, A strategy for faster blind reconstruction of tip geometry for scanned 

probe microscopy, Proc. SPIE 3332(1998)10-18 

 612. L.S.Dongmo, J.S.Villarrubia, S.N.Jones, T.B.Renegar, M.T.Postek, J.F.Song, Experi-

mental test of blind tip reconstruction for scanning probe microscopy, Ultramicroscopy 

85(2000)141-153 

 613. B.A.Todd, S.J.Eppell, A method to improve the quantitative analysis of SFM images at 

the nanoscale, Surface Science 491(2001)473-483 

 614. B.D.Aumond, K.Youcef-Toumi, High precision metrology by means of a novel stereo 

imaging technique based on Atomic Force Microscopy, Proc. SPIE 4344(2001)46-57 

 615. P.E.Mazeran, L.Odoni, J.L.Loubet, Curvature radius analysis for scanning probe mi-

croscopy, Surf.Sci. 585(2005) 25-37 

 616. A.J.Nam, A.Teran, T.A.Lusly, A.J.Melmed, Benign making of sharp tips for STM and 

FIM: Pt, Ir, Au, Pd, and Rh, J. Vac. Sci. Technol. B. 13(1995)1556-1556 

 617. О.В.Шерстюк,  С.Н.Пронькин,  А.Л.Чувилин,  А.Н.Саланов,  Е.Р.Савинова, 

Г.А.Цирлина,  О.А.Петрий,  Электролитические  осадки  платины  на  стеклоуглеро-

де —  закономерности  формирования,  морфология  и  адсорбционные  свойства, 

Электрохимия 36(2000) 836-847 

 618. A.J.Melmed, The art and science and other aspects of making sharp tips, 

J.Vac.Sci.Technol.B 9(1991)601-608 

 619. R.Morgan, An automatic electropolishing supervisor for preparing field ion microscope 

specimens, J.Sci.Instrum. 44(1967)808-809 

 620. A.P.Janssen, J.P.Jones, The sharpening of field emitter tips by ion sputtering, 

J.Phys.D:Appl.Phys. 4(1971)118-124 

 621. A.J.Melmed, J.J.Carroll, An approach to realism in field ion microscopy via zone elec-

tropolishing, J.Vac.Sci.Technol.A 2(1984)1388-1389 

 622. H.W.Fink, Mono-atomic tips for scanning tunneling microscopy, IBM J.Res.Develop. 

30(1986)460-465 

402 

 623. D.K.Biegelsen, F.A.Ponce, J.C.Tramontana, S.M.Koch, Ion milled tips for scanning 

tunneling microscopy, Appl.Phys.Lett. 50(1987)696-698 

 624. D.K.Biegelsen, F.A.Ponce, J.C.Tramontana, Simple ion milling preparation of (111) 

tungsten tips, Appl.Phys.Lett. 54(1989)1223-1225 

 625. J.Mendez, M.Luna, A.M.Baro, Preparation of STM W tips and characterization by 

FEM, TEM and SEM, Surf.Sci. 266(1992)294-298 

 626. H.S.Kim, M.L.Yu, U.Staufer, L.P.Muray, D.P.Kern, T.H.P.Chang, Oxygen processed 

field emission tips for microcolumn application, J.Vac.Sci.Technol.B 11(1993)2327-

2331 

 627. O.Albrektsen, H.W.M.Salemink, K.A.Morch, A.R.Tholen, Reliable tip preparation for 

high-resolution scanning tunneling microscopy, J.Vac.Sci.Technol.B 12(1994)3187-

3190 

 628. C.Schiller, A.A.Koomans, T.L.van Rooy, C.Schonenberger, H.B.Elswijk, Decapitation 

of tungsten field emitter tips during sputter sharpening, Surf.Sci. 339(1995)L925-L930 

 629. P.Hoffrogge, H.Kopf, R.Reichelt, Nanostructuring of tips for scanning probe micros-

copy by ion sputtering: Control of the apex ratio and the tip radius, J.Appl.Phys. 

90(2001)5322-5327 

 630. Y.Akama, E.Nishimura, A.Sakai, H.Murakami, New scanning tunneling microscopy tip 

for measuring surface topography, J.Vac.Sci.Technol.A 8(1990)429-433 

 631. P.J.Bryant, H.S.Kim, Y.C.Zheng, R.Yang, Technique for shaping scanning tunneling 

microscope tips, Rev.Sci.Instrum. 58(1987)1115 

 632. R.Nicolaides, Y.Liang, W.E.Packard, Z.W.Fu, H.A.Blackstead, K.K.Chin, J.D.Dow, 

J.K.Furdyna, W.M.Hu, R.C.Jaklevic, W.J.Kaiser, A.R.Pelton, M.V.Zeller, J.Belina Jr., 

Scanning tunneling microscope tip structures, J.Vac.Sci.Technol.A 6(1988)445-447 

 633. Y.Chen, W.Xu, J.Huang, A simple new technique for preparing STM tips, 

J.Phys.E:Sci.Instrum. 22(1989)455-457 

 634. A.Cricenti, S.Selci, R.Generosi, E.Gori, G.Chiarotti, Sharpening of tungsten tips for 

scanning tunneling microscope, Solid State Commun. 70(1989)897-898 

635. 

J.P.Ibe, P.P.Bey, Jr.,S.L.Brandow, R.A.Brizzolara, N.A.Burnham, D.P.DiLella, 

K.P.Lee, C.R.K.Marrian, R.J.Colton, On electrochemical etching of tips for scanning 

tunneling microscopy, J.Vac.Sci.Technol.A 8(1990)3570-3575 

 636. A.Cricenti, E.Paparazzo, M.A.Scarselli, L.Moretto, S.Selci, Preparation and characteri-

zation of tungsten tips for scanning tunneling microscopy, Rev.Sci.Instrum. 

65(1994)1558-1560 

403 

 637. R.Zhang, D.G.Ivey, Preparation of sharp polycrystalline tungsten tips for scanning tun-

neling microscopy imaging, J.Vac.Sci.Technol.B 14(1996)1-10 

 638. Y.Nakamura, Y.Mera, K.Maeda, A reproducible method to fabricate atomically sharp 

tips for scanning tunneling microscopy, Rev.Sci.Instrum. 70(1999)3373-3376 

 639. L.Anwei, H.Xiaotang, L.Wenhui, J.Guijun, An improved control technique for the elec-

trochemical fabrication of scanning tunneling microscopy microtips, 

Rev.Sci.Instrum.68(1997)3811-3813 

 640. Y.G.Kim, E.H.Choi, S.O.Kang, G.Cho, Computer-controlled fabrication of ultra-sharp 

tungsten tips, J.Vac.Sci.Technol.B 16(1998)2079-2081 

 641. D.I.Kim, H.S.Ahn, Etching voltage control technique for electrochemical fabrication of 

scanning probe microscope tips, Rev.Sci.Instrum. 73(2002)1337-1339 

 642. W.X.Sun, Z.X.Shen, F.C.Cheong, G.Y.Yu, K.Y.Lim, J.Y.Lin, Preparation of cantiliv-

ered W tips for atomic force microscopy and apertureless near-field scanning optical 

microscopy, Rev.Sci.Instrum. 73(2002)2942-2947 

 643. P.Kim, J.H.Kim, M.S.Jeong, D.K.Ko, J.Lee, S.Jeong, Efficient electrochemical etching 

method to fabricate sharp metallic tips for scanning probe microscopes, 

Rev.Sci.Instrum. 77(2006)103706-1-103706-5 

 644. H.Morikawa, K.Goto, Reproducible sharp-pointed tip preparation for field ion micros-

copy by controlled ac polishing, Rev.Sci.Instrum. 59(1988)2195-2197 

 645. R.Fainchtein, P.R.Zarriello, A computer-controlled technique for electrochemical STM 

tip fabrication, Ultramicroscopy 42-44(1992)1533-1537 

 646. M.Fotino, Nanotips by reverse electrochemical etching, Appl.Phys.Lett. 60(1992)2935-

2937 

647. 

M.Fotino, Tip sharpening by normal and reverse electrochemical etching, 

Rev.Sci.Instrum. 64(1993)159-167 

 648. I.H.Musselman, P.E.Russell, Platinum/iridium tips with controlled geometry for scan-

ning tunneling microscopy, J.Vac.Sci.Technol.A 8(1990)3558-3562 

 649. A.A.Gorbunov, B.Wolf, J.Edelmann, The use of silver tips in scanning tunneling mi-

croscopy, Rev.Sci.Instrum. 64(1993)2393-2394 

 650. M.Klein, G.Schwitzgebel, An improved lamellae drop-off technique for sharp tip prepa-

ration in scanning tunneling microscopy, Rev.Sci.Instrum. 68(1997)3099-3103 

 651. S.Kerfriden, A.H.Nahle, S.A.Campbell, F.C.Walsh, J.R.Smith, The electrochemical 

etching of tungsten STM tips, Electrochimica Acta 43(1998)1939-1944 

404 

 652. A.D.Muller, F.Muller, M.Hietschold, F.Demming, J.Jersch, K.Dickmann, Characteriza-

tion of electrochemically etched tungsten tips for scanning tunneling microscopy, 

Rev.Sci.Instrum. 70(1999)3970-3972 

 653. M.Kulawik, M.Nowicki, G.Thielsch, L.Cramer, H.-P.Rust, H.-J.Freund, T.P.Pearl, 

P.S.Weiss, A double lamellae dropoff etching procedure for tungsten tips attached to 

tuning fork atomic force microscopy/scanning tunneling microscopy sensors, Review of 

Sci.Instrum. 74(2003)1027-1030 

 654. H.Lemke, T.Goddenhenrich, H.P.Bochem, U.Hartmann, C.Heiden, Improved microtips 

for scanning probe microscopy, Rev.Sci.Instrum. 61(1990)2538-2341 

 655. J.P.Song, N.H.Pryds, K.Glejbol, K.A.Morch, A.R.Tholen, L.N.Christensen, A devel-

opment in the preparation of sharp scanning tunneling microscopy tips, 

Rev.Sci.Instrum. 64(1993)900-903 

 656. M.Greiner, P.Kruse, Recrystallization of tungsten wire for fabrication of sharp and sta-

ble nanoprobe and field-emitter tips, Rev.Sci.Instrum. 78(2007)026104-1-026104-3 

 657. J.Garnaes, F.Kragh, K.A.Morch, A.R.Tholen, Transmission electron microscopy of 

scanning tunneling tips, J.Vac.Sci.Technol.A 8(1990)441-444 

 658. I.Ekvall, E.Wahlstrom, D.Claesson, H.Olin, E.Olsson, Preparation and characterization 

of electrochemically etched W tips for STM, Meas.Sci.Technol. 10(1999)11-18 

 659. L.A.Hocket, S.E.Creager, A convenient method for removing surface oxides from tung-

sten STM tips, Rev.Sci.Instrum. 64(1993)263-264 

 660. L.Ottaviano, L.Lozzi, S.Santucci, Scanning Auger microscopy study of W tips for scan-

ning tunneling microscopy, Rev.Sci.Instrum. 74(2003)3368-3378 

 661. E.Paparazzo, L.Moretto, S.Selci, M.Righini, I.Farne, Effects of HF attack on the surface 

and interface microchemistry of W tips for use in the STM microscope: a scanning Au-

ger microscopy (SAM) study, Vacuum 52(1999)421-426 

 662. J.E.Fasth, B.Loberg, H.Norden, Preparation of contamination-free tungsten specimens 

for the field-ion microscope, J.Sci.Instrum. 44(1967)1044-1045 

 663. B. Zhang, E. Wang, Fabrication of STM tips with controlled geometry by electrochemi-

cal etching and ECSTM tips coated with paraffin, Electrochim. Acta, 39(1994)103-106 

664. 

C.E.Bach, R.J.Nichols, W.Beckmann, H.Meyer, A.Schulte, J.O.Besenhard, 

P.D.Jannakoudakis, Effective Insulation of Scanning Tunneling Microscopy Tips for 

Electrochemical Studies Using an Electropainting Method, J.Electrochem.Soc. 

140(1993)1281-1284 

 665. D.E.Stilwell, S.M.Park, Electrochemistry of Conductive Polymers. II.Electrochemical 

Studies on Growth Properties of Polyaniline, J.Electrochem.Soc. 135(1988)2254-2262 

405 

 666. M.Поуп,  Изополи-  и  гетерополиоксометаллаты.  М.,  Наука,  Новосибирк, 1990, 

С.112. 

 667. Inert Anodes for Aluminium Elecrolysis, 1st edition, I.Galasiu, R.Galasiu, J.Thonstad, 

Aluminium-Verlag, Germany, 2007 

 668. R P. Pawlek, Inert anodes: an update, Light Metals, 2008, 1039-1045 

 669. Д.А.Симаков, П.В.Поляков, В.А.Блинов, Ю.Н.Попов, Инертные аноды в электро-

литическом производстве алюминия, Цветные металлы №12 (2001) 95 

 670. Y.X.Liu, J.Thondstad, Oxygen overvoltage on SnO

2

-based anodes in NaF-AlF

3

-Al

2

O

3

melts. Electrocatalytic effects of doping agents, Electrochim. Acta 28(1983)113-116. 

 671. A.M.Vecchio-Sadus, D.C.Constable, R.Dorin, E.J.Frazer, I.Fernandez, G.S.Neal, 

S.Lathabai, M.B.Trigg, Tin dioxide-based ceramics as inert anodes for aluminium 

smelting: a laboratory study, Light Metals, 1996, 259-265. 

 672. H. Xiao. R. Hovland, S. Rolseth,  J. Thonstad, Studies on the Corrosion and the Behav-

ior of Inert Anodes in Aluminum Electrolysis, Metallur Mater Trans B, 27 (1996)185-

194. 

 673. R.Keller, S.Rolseth, J.Thondstad, Mass transport considerations for the development of 

oxygen-evolving anodes in aluminum electrolysis, Electrochim. Acta 42(1997)1809-

1817. 

 674. A.-M.Popescu, S.Michaiu, S.Zuca, Microstructure and Electrochemical Behaviour of 

some SnO

2

-based Inert Electrodes in Aluminium Electrolysis, Z.Naturforsch. A 

57(2002) 71-75. 

 675. I.Galasiu, D.Popescu, R.Galasiu, M.Modan, P.Stanciu, Results of 100 hours electrolysis 

test of inert anodes in a pilot cell, Light Metals 1997, 273-280. 

 676. C.Wang, J.Wang, C.Wang, H.Chen, W.Su, G.Zang, P.Qi, Nonlinear electrical charac-

teristics of SnO

2

•CuO ceramics with different donors, J.Appl.Phys. 97 (2005) 126103-1-

126103-3; S.R. Dhage, V. Ravi, Influence of various donors on nonlinear I-V character-

istics of tin dioxide ceramics, Appl. Phys. Lett., 83 (2003) 4539 - 4541. 

 677. K.Uematsu, N.Mizutani, M.Kato, Electrical properties of high purity tin dioxide doped 

with antimony, J.Mater.Sci. 22(1987)915-918 

 678. J.A.Cerri, E.R.Leite, D.Gouvea, E.Longo, J.A.Varela, Effect of Cobalt(II) oxide and 

Manganese (IV) oxide on Sintering of Tin (IV) Oxide, J.Am.Ceram.Soc. 79(1996)799-

804 

 679. N. Dolet, J.-M. Heintz, M. Onillon, J.-P. Bonnet, Densification of 0.99SnO

2

-0.01CuO 

Mixture: Evidence for Liquid Phase Sintering, J. Eur. Ceram. Soc., 9 (1992) 19 - 25.