Добавлен: 06.02.2019
Просмотров: 15898
Скачиваний: 9
406
680. M.R.Cassia-Santos, V.C.Sousa, M.M.Oliveira, F.R.Sensato, W.K.Bacelar, J.W.Gomesa,
E.Longoa, E.R.Leite, J.A.Varela, Recent research developments in SnO
2
-based varis-
tors, Materials Chemistry and Physics 90 (2005) 1-9
681. R.Metz, J.Morel, M.Houabes, J.Pansiot, M.Hassanzadeh, High voltage characterization
of tin oxide varistors, J.Mater.Sci 42 (2007) 10284-10287
682. P.R.Bueno, J.A.Varela, E.Longo, SnO
2
, ZnO and related polycrystalline compound
semiconductors: An overview and review on the voltage-dependent resistance (non-
ohmic) feature, Journal of the European Ceramic Society 28 (2008) 505-529
683. S. Zuca, M. Terzi, M. Zaharescu, K. Matiasovsky, Contribution to the study of SnO
2
-
based ceramics. Part II. Effect of various oxide additives on the sintering capacity and
electrical conductivity of SnO
2
, J. Mater. Sci., 26 (1991) 1673 – 1676.
684. J.Thonstad, P.Fellner, G.M.Haarberg, J.Hives, H.Kvande, A.Sterten, Aluminium Elec-
trolysis. Fundamentals of the Hall-Heroult Process, 3rd edition, Aluminium-Verlag,
Germany, 2001
685. Ю.Г.Михалев, В.А.Блинов, П.В.Поляков, О некоторых особенностях электрохи-
мических поляризационных измерениях в системе жидкий металлический элек-
трод – солевой расплав, Расплавы, № 4 (1991) 8–13
686. H.Xiao, J.Thonstad, S.Rolseth, The Solubility of SnO
2
in NaF-AlF
3
-Al
2
O
3
Melts, Acta
Chemica Scandinavica, 49 (1995) 96-102
687. J.-H.Yang, J.Thonstad, On the behaviour of tin-containing species in cryolite-alumina
melts, J.Appl.Electrochem. 27 (1997) 422-427
688. L.Issaeva, J,Yang, G.M.Haarberg, J.Thonstad, N.Aalberg, Electrochemical behaviour of
tin species dissolved in cryolite-alumina melts, Electrochim.Acta 42 (1997) 1011-1018
689. B.Scharifker, G.Hills, Theoretical and experimental studies of multiple nucleation, Elec-
trochim.Acta 28 (1983) 879-889
690. K.S.Osen, C.Rosenkilde, A.Solheim, E.Skybakmoen, The behaviour of moisture in
cryolite melts, Light Metals 2009, 395-400
691. C.F. Windish Jr., S.C. Marschman, Electrochemical polarization studies on Cu and Cu-
containing cermet anodes for the aluminium industry, Light Metals 1987, R.D.
Zabreznik ed., Light Metals (1987) 351-355
692. P.G. Russell, Activity of anodic oxide films on metal and cermet anodes in cryolite-
alumina melts, J.Appl. Electrochem, 16 (1986) 147-155
693. S.Pietrzyk, Electrochemical testing of inert anodes for alu-minium electrolysis, World
of Metallurgy - ERZMETALL 60 (2007) 255-259
407
694. S.Zuca, A.Popescu, N.Ene, V.Constantin, Studiul anozilor inerti pe baza de SnO
2
in
topiturile criolit-alumina, Revista de Chimie 50 (1999) 42-47
695. O. Scarlat, M. Susana-Mihaiu, M. Zaharescu, Semiconducting densified SnO
2
-ceramics
obtained by a novel sintering technique, J. Eur. Ceram. Soc., 22 (2002) 1839-1846
696. C.Li, J.Wang, W.Su, H.Chen, W.Wang, D.Zhuang, Investigation of electrical properties
of SnO
2
•Co
2
O
3
•Sb
2
O
3
varistor system, Physica B 307 (2001) 1-8
697. C.Wang, J.Wang, W.Su, Microstructural Morphology and Electrical Properties of Cop-
per- and Niobium-Doped Tin Dioxide Polycrystalline Varistors, J. Am. Ceram. Soc., 89
(2006) 2502-2508
698. C.Wang, J.Wang, W.Su, G.Zang, P.Qi, Electrical properties of SnO
2
•CuO•Ta
2
O
5
varis-
tor system, Materials Letters 59 (2005) 201-204
699. H.R.Kokabi, J.Provost, G.Desgardin, A new device for electrical resistivity measure-
ments as a function of temperature (86-700K) under controlled atmosphere by the four-
probe method, Rev.Sci.Instrum. 64 (1993) 1549-1553
700. M.Rumyantseva, M.Labeau, G.Delabouglise, L.Ryabova, I.Kutsenok, A.Gaskov, Cop-
per and nickel doping effect on interaction of SnO
2
with H
2
S, J. Mater. Chem., 7 (1997)
1785-1790
701. R.S.Niranjan, K.R.Patil, S.R.Sainkar, J.S.Mulla, High H
2
S-sensitive copper-doped tin
oxide thin films, Materials Chemistry and Physics 80 (2003) 250-256
702. J.Ni, X.Zhao, X.Zheng, J.Zhao, B.Liu, Electrical, structural, photoluminescence and op-
tical properties of p-type conducting, antimony-doped SnO
2
thin films, Acta Materialia
57(2009)278-285
703. M.M.Bagheri-Mohagheghi, N.Shahtahmasebi, M.R.Alinejad, A.Youssefi, M.Shokooh-
Saremi, Fe-doped SnO
2
transparent semi-conducting thin films deposited by spray pyro-
lysis technique: Thermoelectric and p-type conductivity properties, Solid State Science
11(2009)233-239
704. S.Ji, Z.He, Y.Song, K.Liu, Z.Ye, Fabrication and characterization of indium-doped p-
type SnO
2
thin films, J.Cryst.Growth 259(2003)282-285
705. Милнс А., Фойхт Д. Гетеропереходы и переходы металл-полупроводник. М.: Мир,
1975. 432 с.
706. Б.И.Шкловский, А.Л.Эфрос, Электронные свойства сильно легированных полу-
проводников. М., Наука, 1979
707. S.Mihaiu, O.Scarlat, G.Aldica, M.Zaharescu, Electronic conduction of the Sn
1-x
Cu
x/3
Sb
2x/3
O
2
(x ≤ 1/2) rutile type structures, J.Optoelectr. Adv. Mater. 5(2003)913-918
408
708. M.K.Paria, H.S.Maiti, Electrical conductivity and defect structure of polycrystalline tin
dioxide doped with antimony oxide, J.Mater.Sci. 17(1982)3275-3280
709. T.Sahm, A.Gurlo, N.Barsan, U.Weimar, Basics of oxygen and SnO
2
interaction; work
function change and conductivity measurements, Sensors and Actuators B 118 (2006)
78-83
710. Encyclopedia of Electrochemistry, Volume 6, Semiconductor Electrodes and Photo-
electrochemistry. Editors: A.J. Bard, M. Stratmann, S. Licht, Wiley-VCH:2002
711. V.S.Bagotsky, Fundamentals of Electrochemistry, Second Edition, Wiley, 2006
712. J.C.Tranchart, L.Hollan, R.Memming, Localized Avalance Breakdown on GaAs Elec-
trodes in Aqueous Electrolytes, J.Electrochem.Soc. 125 (1978) 1185-1187
713. M.S.Castro, C.M.Aldao, Characterization of SnO
2
-Varistors with Different Additives,
J.Europ.Ceram.Soc. 18(1998)2233-2239
714. A.P.Rizzato, C.V.Santilli, S.H.Pulcinelli, D.Stuerga, D.Chaumont, V.Briois, Densifica-
tion of Mn-Doped Tin Oxide Films by Conventional Heating and Microwave Heating
Treatment, Physica Scripta, 115(2005)291-293
715. Г.А. Цирлина, Ю.Е.Рогинская, Г.Г.Постовалова, Электрохимическое поведение
SnO
2
-TiO
2
оксидных наноструктур на стеклоуглеродных подложках, Электрохи-
мия 34(1998) 569-574
716. Г.Г.Постовалова, О.В.Морозова, Б.Ш.Галямов, Е.Н.Лубнин, С.Г.Прутченко,
Н.В.Козлова, Ю.Е.Рогинская, Наноструктурированные пленки на основе смешан-
ных оксидов олова и титана, Журнал неорганической химии, 43(1998)36-46
717. Г.Г.Постовалова, Ю.Е.Рогинская, С.А.Завьялов, Б.Ш.Галямов, Н.Л.Климасенко,
Образование областей с высокой проводимостью в наноструктурированных плен-
ках SnO
2
-AO
x
(A=Ti
4+
, Zr
4+
, Sb
3+
, Sb
5+
) под воздействием УФ-облучения или H
2
,
Неорганические материалы 36(2000)452-463
718. Т.Л.Кулова, А.М.Скундин, Ю.Е.Рогинская, Ф.Х.Чибирова, Интеркаляция лития в
наноструктурированные пленки на основе оксидов олова и титана, Электрохимия,
40 (2004) 484-492
719. M. Pourbaix, Atlas d’Equilibres Electrochemiques, Gauthier-Villars, Paris, 1963.
720. M.Metikos-Hukovic, A.Resetic, V.Gvozdic, Behaviour of tin as a valve metal, Electro-
chim.Acta 40(1995)1777-1779
721. R.Diaz, S.Joiret, A.Cuesta, I.Diez-Perez, P.Allongue, C.Gutierrez, P.Gorostiza, F.Sanz,
Electrochemically Grown Tin Oxide Thin Films: In Situ Characterization of Electronic
Properties and Growth Mechanism, J.Phys.Chem.B 108(2004)8173-8181
409
722. I.A.Courtney, J.R.Dahn, Key Factors Controlling the Reversibility of the Reaction of
Lithium with SnO
2
and Sn
2
BPO
6
Glass, J.Electrochem.Soc. 144(1997)2943-2948
723. I.A.Courtney, J.R.Dahn, Electrochemical and In Situ X-Ray Diffraction Studies of the
Reaction of Lithium with Tin Oxide Composities, J.Electrochem.Soc. 144(1997)2045-
2052
724. K. J. Stout, P. J. Sullivan, W. P. Dong, E. Mainsah, N. Luo, T. Mathia, H. Zahouani
(1994), The development of methods for the characterization of roughness on three di-
mensions. Publication no. EUR 15178 EN of the Commission of the European Commu-
nities, Luxembourg,
725. G. Barbato, K. Carneiro, D. Cuppini, J. Garnaes, G. Gori, G. Hughes, C. P. Jensen, J. F.
Jørgensen, O. Jusko, S. Livi, H. McQuoid, L. Nielsen, G. B. Picotto, G. Wilkening
Scanning tunnelling microscopy methods for roughness and micro hardness measure-
ments, Synthesis report for research contract with the European Union under its pro-
gramme for applied metrology, European Commission Catalogue number: CD-NA-
16145 EN-C, Brussels Luxenburg (1995).
726. M.Aguilar, A.I.Oliva, E.Anguiano, Imaging in scanning tunneling microscopy and its
relationship with surface roughness, Europhys.Lett. 46(1999)442-447
727. M.Aguilar, A.I.Oliva, E.Anguiano, The importance of imaging conditions in scanning
tunneling microscopy for the determination of surface texture and roughness, Surf.Sci.
420(1999)275-284
728. V.Lakshminarayanan, R.Srinivasan, D.Chu, S.Gilman, Area determination in fractal
surfaces of Pt and Pt-Ru electrodes, Surface Science 392(1997)44-51
729. H.M.Saffarian, R.Srinivasan, D.Chu, S.Gilman, Area determination in fractal surfaces
of Pt and Pt-Ru catalysts for methanol oxidation, Electrochimica Acta 44 (1998) 1447-
1454
730. P.Klapetek, I.Ohlidal, J.Bilek, Influence of the atomic force microscope tip on the mul-
tifractal analysis of rough surfaces, Ultamicroscopy 102(2004)51-59
731. J.B.da Silva Jr., E.A.de Vasconcelos, B.E.C.A.dos Santos, J.A.K.Freire, V.N.Freire,
G.A.Farias, E.F.da Silva Jr., Statistical analysis of topographic images of nanoporous
silicon and model surfaces, Microelectronics Journal, 36(2005)1011-1015
732. P.Falaras, A.P.Xagas, Roughness and fractality of nanostructured TiO
2
films prepared
via sol-gel technique, J.Mater.Sci. 37(2002)3855-3860
733. M.Khaneghie, A.Zendehnam, M.Mirzaei, Statistical characteristics of fluctuation of
heights, surface roughness and fractal properties of Cu thin films, J.Phys.:Conf.Ser.
61(2007)529-533
410
734. M.C.Lafouresse, P.J.Heard, W.Schwarzacher, Surface roughness analysis of electro-
plated Cu, Electrochim.Acta 53(2007)229-232
735. A. Harriman, G. R. Millward, P. Neta, M. C. Richoux, J. M. Thomas, Interfacial elec-
tron-transfer reactions between platinum colloids and reducing radicals in aqueous solu-
tion, J. Phys. Chem., 92(1988)1286-1290
736. D.N.Furlong, A.Launikonis, W.H.F.Sasse, J.V.Sanders, Colloidal platinum sols. Prepa-
ration, characterization and stability towards salt, J. Chem. Soc., Faraday Trans.
80(1984) 571-588
737. K.A.Friedrich, F.Henglein, U.Stimming, W.Unkauf, Investigation of Pt particles on
gold substrates by IR spectroscopy. Particle structure and catalytic activity, Colloids and
Surfaces A 134(1998)193-206
738. K.A.Friedrich, F.Henglein, U.Stimming, W.Unkauf, Size dependence of the CO
monolayer oxidation on nanosized Pt particles supported on gold, Electrochim.Acta
45(2000)3283-3293
739. Sh. K. Shaikhutdinov, F. A. Möller, G. Mestl, R. J. Behm, Electrochemical Deposition
of Platinum Hydrosol on Graphite Observed by Scanning Tunneling Microscopy, Jour-
nal of Catalysis, 163(1996)492-495
740. E. Rach, J. Heitbaum, Electrochemically induced surface modifications of Pt-Au alloy,
Electrochimica Acta, 32(1987)1173-1180
741. L.M. Plyasova, I.Yu. Molina, A.N. Gavrilov, S.V. Cherepanova, O.V. Cherstiouk, N.A.
Rudina, E.R. Savinova, G.A. Tsirlina, Electrodeposited platinum revisited: Tuning
nanostructure via the deposition potential, Electrochimica Acta (2006) 51, 4477-4488
742.
O.V.Cherstiouk, A.N.Gavrilov, L.M.Plyasova, I.Yu.Molina, G.A.Tsirlina,
E.R.Savinova, Influence of structural defects on the electrocatalytic activity of platinum,
J.Solid State Electrochem 12(2008)497-509
743. Л.М.Плясова, И.Ю.Молина, С.В.Черепанова, Н. А. Рудина, Е.Р.Савинова,
С.Н.Пронькин, Г.А Цирлина, Рентгеновская дифрактометрия и микроскопия дис-
персных электролитических осадков платины и палладия субмикронных толщин
на поликристаллических подложках, Электрохимия 38(2002)1236-1252
744. P. G. Allen, S. D. Conradson, M. S. Wilson, S. Gottesfeld, I. D. Raistrick, J. Valerio, M.
Lovato, In situ structural characterization of a platinum electrocatalyst by dispersive x-
ray absorption spectroscopy, Electrochim. Acta, 39(1994)2415-2418
745. Y. Takasu, N. Ohashi, X. -G. Zhang, Y. Murakami, H. Minagawa, S. Sato, K. Yahiko-
zawa, Size effects of platinum particles on the electroreduction of oxygen, Electrochim.
Acta, 41(1996)2595-2600