Файл: Ersoy O.K. Diffraction, Fourier optics, and imaging (Wiley, 2006)(ISBN 0471238163)(427s) PEo .pdf
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372 |
NUMERICAL METHODS FOR RIGOROUS DIFFRACTION THEORY |
Figure 20.4. 1-D FZP with m ¼ 3.
When the modeled region extends to infinity, absorbing boundary conditions (ABCs) are used at the boundary of the grid. This allows all outgoing waves to leave the region with negligible reflection. The region of interest can also be enclosed by a perfect electrical conductor.
Once the fields are calculated for the specified number of time steps, near zone transient and steady state fields can be visualized as color intensity images, or a field component at a specific point can be plotted versus time. When the steady-state output is desired, observing a specific point over time helps to indicate whether a steady-state has been reached.
In the computer experiments performed, a cell size of l=20 was used [Kuhl, Ersoy]. The excitation was a y-polarized sinusoidal plane wave propagating in the z-direction. All diffracting structures were made of perfect electrical conductors. All edges of the diffracting structures were parallel to the x-axis to avoid canceling the y-polarized electric field.
A 1-D FZP is the same as the FZP discussed in Section 15.10 with the x-variable dropped. The mode m is defined as the number of even or odd zones which are opaque.
An example with three opaque zones (m ¼ 3) is shown in Figure 20.4.
Using XFDTD, a 1-D FZP with a thickness of 0:1l and focal length 3l was simulated. Its output was analyzed for the first three modes. The intensity along the z-axis passing through the center of the FZP is plotted as a function of distance from the FZP in Figure 20.5. The plot shows that the intensity peaks near 3l behind the plate, and gets higher and narrower as the mode increases. The peak also gets closer to the desired focal length of 3l for higher modes.
The plot of the intensity along the y-axis at the focal line is shown in Figure 20.6. The plot shows that the spot size decreases with increasing mode and side lobe intensity is reduced for higher modes.
These experiments show that the FDTD method provides considerable freedom in generating the desired geometry and specifying material parameters. It is especially useful when the scalar diffraction theory cannot be used with sufficient accuracy due to reasons such as difficult geometries and/or diffracting apertures considerably smaller than the wavelength.
FOURIER MODAL METHODS |
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where K ¼ 2p= . The field components can be written as [Lalanne and Morris 1996]
X
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Ex ¼ |
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m |
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SmðzÞe jðKmþbÞx |
ð20:7-3Þ |
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Ez ¼ |
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ð20:7-4Þ |
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m |
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fmðzÞe jðKmþbÞx |
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Hy ¼ |
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ð20:7-5Þ |
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m |
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UmðzÞe jðKmþbÞx |
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where b ¼ k sin y ¼ |
2p |
y. |
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l |
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Maxwell’s curl equations in this case are given by |
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dEz |
þ |
dEx |
¼ jwmoHy |
ð20:7-6Þ |
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dx |
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dx |
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dHy |
¼ jweEx |
ð20:7-7Þ |
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dz |
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1 dHy |
¼ jwEz |
ð20:7-8Þ |
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e |
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dx |
Prime and double prime quantities will be used to denote the first and second partial derivatives with respect to the z-variable. Using Eqs. (20.7-3)–(20.7-5) in Eqs. (20.7-6)–(20.7-8) results in
jðKm þ bÞfm þ Sm0 ¼ jkoUm |
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ð20:7-9Þ |
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Um0 ¼ jko Xp |
em pSp |
ð20:7-10Þ |
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Xp ðpK þ bÞam pUp |
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fm ¼ |
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ð20:7-11Þ |
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ko |
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Using Eq. (20.7-11) in Eq. (20.7-9) yields |
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Sm0 ¼ jkoUm þ |
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ðKm þ bÞ Xp |
ðpK þ bÞam pUp |
ð20:7-12Þ |
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ko |
In practice, the sums above are truncated with jpj M. Then, Eqs. (20.7-10) and (20.7-12) make up an eigenvalue problem of size 2ð2M þ 1Þ. However, it turns out to be more advantageous computationally to compute the second partial derivative of Um with Eq. (20.7-10) and obtain [Caylord, Moharam, 85], [Peng]
X |
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Um00 ¼ ko2( p |
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ðrK þ bÞap rUr) ð20:7-13Þ |
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em p Up |
ko |
ðpK þ bÞ |
ko |